T01000 - SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality Revision:SEMI T10-0701 (Reapproved 0923) - Current in both characteristic shape and

in both characteristic shape and magnitude

SEMI E88-0307 (technical revision)

·    緊急操作

SEMI E132-0924 (Reapproved 1224)

T01000 - SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality Revision:SEMI T10-0701 (Reapproved 0923) - Current in both characteristic shape andThis Standard is intended to define the methodology for the assessment of 2D Data Matrix direct mark quality. This Standard defines assessment criteria, metrology methods, and assessment reporting procedures as applied to 2D Data Matrix code direct marks on semiconductor related materials. Application specifications, which refer to this Standard, may further limit its scope to more specific requirements of a particular application. Referenced SEMI